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[IEEE Twenty-Second Annual IEEE Semiconductor Thermal Measurement And Management Symposium - Dallas, TX USA (March 14-16, 2006)] Twenty-Second Annual IEEE Semiconductor Thermal Measurement And Management Symposium - Thermal resistance measurement of LEDswith multi-chip packages
Lan Kim,, Moo Whan Shin,Year:
2006
Language:
english
DOI:
10.1109/STHERM.2006.1625226
File:
PDF, 439 KB
english, 2006