[IEEE Twenty-Second Annual IEEE Semiconductor Thermal...

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[IEEE Twenty-Second Annual IEEE Semiconductor Thermal Measurement And Management Symposium - Dallas, TX USA (March 14-16, 2006)] Twenty-Second Annual IEEE Semiconductor Thermal Measurement And Management Symposium - Thermal resistance measurement of LEDswith multi-chip packages

Lan Kim,, Moo Whan Shin,
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Year:
2006
Language:
english
DOI:
10.1109/STHERM.2006.1625226
File:
PDF, 439 KB
english, 2006
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