[IEEE 2013 IEEE 20th International Conference on Electronics, Circuits, and Systems (ICECS) - Abu Dhabi, United Arab Emirates (2013.12.8-2013.12.11)] 2013 IEEE 20th International Conference on Electronics, Circuits, and Systems (ICECS) - Enhancing dictionary based test data compression using the ATE repeat instruction
Sismanoglou, Panagiotis, Nikolos, DimitrisYear:
2013
Language:
english
DOI:
10.1109/ICECS.2013.6815439
File:
PDF, 431 KB
english, 2013