[IEEE 2013 IEEE 20th International Conference on...

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[IEEE 2013 IEEE 20th International Conference on Electronics, Circuits, and Systems (ICECS) - Abu Dhabi, United Arab Emirates (2013.12.8-2013.12.11)] 2013 IEEE 20th International Conference on Electronics, Circuits, and Systems (ICECS) - Enhancing dictionary based test data compression using the ATE repeat instruction

Sismanoglou, Panagiotis, Nikolos, Dimitris
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Year:
2013
Language:
english
DOI:
10.1109/ICECS.2013.6815439
File:
PDF, 431 KB
english, 2013
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