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[IEEE First International Symposium on Empirical Software Engineering and Measurement (ESEM 2007) - Madrid, Spain (2007.09.20-2007.09.21)] First International Symposium on Empirical Software Engineering and Measurement (ESEM 2007) - A Survey of Enterprise Software Development Risks in a Flat World
Bhuta, Jesal, Mallick, Sudeep, Subrahmanya, S.V.Year:
2007
Language:
english
DOI:
10.1109/esem.2007.74
File:
PDF, 80 KB
english, 2007