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[IEEE 2012 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2012.12.10-2012.12.13)] 2012 International Electron Devices Meeting - Standard cell level parasitics assessment in 20nm BPL and 14nm BFF
Schuddinck, P., Badaroglu, M., Stucchi, M., Demuynck, S., Hikavyy, A., Garcia-Bardon, M., Mercha, A., Mallik, A., Chiarella, T., Kubicek, S., Athimulam, R., Collaert, N., Horiguchi, N., Debusschere, IYear:
2012
Language:
english
DOI:
10.1109/IEDM.2012.6479101
File:
PDF, 4.12 MB
english, 2012