[IEEE 2008 IEEE/LEOS Internationall Conference on Optical...

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[IEEE 2008 IEEE/LEOS Internationall Conference on Optical MEMs and Nanophotonics - Freiburg, Germany (2008.08.11-2008.08.14)] 2008 IEEE/LEOS International Conference on Optical MEMs and Nanophotonics - A micromirror scanner with vertical combs tilted by assembly process

Min-Ho Jun,, Sungsik Yun,, Man Geun Kim,, Sung-Kil Lee,, Jong-Hyun Lee,
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Year:
2008
Language:
english
DOI:
10.1109/OMEMS.2008.4607871
File:
PDF, 407 KB
english, 2008
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