[IEEE 1999 IEEE/ACM International Conference on Computer-Aided Design. Digest of Technical Papers - San Jose, CA, USA (7-11 Nov. 1999)] 1999 IEEE/ACM International Conference on Computer-Aided Design. Digest of Technical Papers (Cat. No.99CH37051) - Techniques for improving the efficiency of sequential circuit test generation
Xijiang Lin,, Pomeranz, I., Reddy, S.M.Year:
1999
Language:
english
DOI:
10.1109/iccad.1999.810639
File:
PDF, 607 KB
english, 1999