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[IEEE 1995 IEEE 5th International Conference on Conduction and Breakdown in Solid Dielectrics - Leicester, UK (10-13 July 1995)] Proceedings of 1995 IEEE 5th International Conference on Conduction and Breakdown in Solid Dielectrics - Electrical and photoelectrical properties of MIS structures with rare earth oxide films as insulator
Rozhkov, V.A., Goncharov, V.P., Trusova, A.Yu.Year:
1995
Language:
english
DOI:
10.1109/icsd.1995.523047
File:
PDF, 193 KB
english, 1995