![](/img/cover-not-exists.png)
[IEEE 2011 IEEE 6th International Workshop on Electronic Design, Test and Application (DELTA) - Queenstown, New Zealand (2011.01.17-2011.01.19)] 2011 Sixth IEEE International Symposium on Electronic Design, Test and Application - Automatic Yield Management System for Semiconductor Production Test
Cheng, Huiyuan, Ooi, Melanie Po-Leen, Kuang, Ye Chow, Sim, Eric, Cheah, Bryan, Demidenko, SergeYear:
2011
Language:
english
DOI:
10.1109/delta.2011.53
File:
PDF, 1.05 MB
english, 2011