[IEEE 2002 IEEE Conference on Electrical Insulation and...

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[IEEE 2002 IEEE Conference on Electrical Insulation and Dielectric Phenomena - Cancun, Mexico (20-24 Oct. 2002)] Annual Report Conference on Electrical Insulation and Dielectric Phenomena - Determination of charge trapping ability in doped α-alumina

Liebault, J., Siesse-Moya, D., Moya, F., Zarbout, K., Damamme, G., Moya, G.
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Year:
2002
Language:
english
DOI:
10.1109/ceidp.2002.1048880
File:
PDF, 264 KB
english, 2002
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