[IEEE 2002 IEEE Conference on Electrical Insulation and Dielectric Phenomena - Cancun, Mexico (20-24 Oct. 2002)] Annual Report Conference on Electrical Insulation and Dielectric Phenomena - Determination of charge trapping ability in doped α-alumina
Liebault, J., Siesse-Moya, D., Moya, F., Zarbout, K., Damamme, G., Moya, G.Year:
2002
Language:
english
DOI:
10.1109/ceidp.2002.1048880
File:
PDF, 264 KB
english, 2002