[IEEE 2008 IEEE International Electron Devices Meeting...

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[IEEE 2008 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2008.12.15-2008.12.17)] 2008 IEEE International Electron Devices Meeting - Stack friendly all-oxide 3D RRAM using GaInZnO peripheral TFT realized over glass substrates

Lee, M.-J., Lee, C. B., Kim, S., Yin, H., Park, J., Ahn, S. E., Kang, B. S., Kim, K. H., Stefanovich, G., Song, I., Kim, SW., Lee, J. H., Chung, S. J., Kim, Y. H., Lee, C. S., Park, J. B., Baek, I. G.
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Year:
2008
Language:
english
DOI:
10.1109/iedm.2008.4796620
File:
PDF, 811 KB
english, 2008
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