![](/img/cover-not-exists.png)
[IEEE Conference onOptical Network Design and Modeling, 2005. - Milan, Italy (Feb. 7-9, 2005)] Conference onOptical Network Design and Modeling, 2005. - A study of fault tolerant architectures for electronic in- and egress interconnections in optical burst/packet switched networks
Andreassen, R.O., Helvik, B.E., Sudbo, A.S., Zouganeli, E.Year:
2005
Language:
english
DOI:
10.1109/ondm.2005.1427033
File:
PDF, 1.72 MB
english, 2005