[IEEE 2009 IEEE Circuits and Systems International Conference on Testing and Diagnosis - Chengdu , China (2009.04.28-2009.04.29)] 2009 IEEE Circuits and Systems International Conference on Testing and Diagnosis - Development of a Test System of SINS/GPS Integrated Navigation System
He, Guang-Jun, Li, Bao-Quan, Wang, Jiu-Yang, Wang, Jin-BoYear:
2009
Language:
english
DOI:
10.1109/cas-ictd.2009.4960807
File:
PDF, 222 KB
english, 2009