[Japan Soc. Appl. Phys 2001 Symposium on VLSI Circuits. Digest of Technical Papers - Kyoto, Japan (14-16 June 2001)] 2001 Symposium on VLSI Circuits. Digest of Technical Papers (IEEE Cat. No.01CH37185) - Bit line coupling scheme and electrical fuse circuit for reliable operation of high density DRAM
Kyunam Lim,, Sangseok Kang,, Jonghyun Choi,, Jaehoon Joo,, Younsang Lee,, Jinseok Lee,, Sooin Cho,, Byungil Ryu,Year:
2001
Language:
english
DOI:
10.1109/vlsic.2001.934186
File:
PDF, 196 KB
english, 2001