[IEEE 2008 International Conference on Advanced Semiconductor Devices and Microsystems (ASDAM) - Smolenice, Slovakia (2008.10.12-2008.10.16)] 2008 International Conference on Advanced Semiconductor Devices and Microsystems - ID-array of metallic nanowires as sensing element for optical sensor: modeling and characterization
Dmitruk, N.L., Mayeva, O.I., Korovin, A.V., Mamykin, S.V., Sosnova, M.V., Min'ko, V.I.Year:
2008
Language:
english
DOI:
10.1109/asdam.2008.4743368
File:
PDF, 1.86 MB
english, 2008