The detection of defects in a niobium tri-layer process
Joseph, A.A., Heuvelmans, S., Gerritsma, G.J., Kerkhoff, H.G.Volume:
13
Language:
english
Journal:
IEEE Transactions on Appiled Superconductivity
DOI:
10.1109/tasc.2003.813654
Date:
June, 2003
File:
PDF, 1.50 MB
english, 2003