[IEEE Comput. Soc. Press 14th VLSI Test Symposium - Princeton, NJ, USA (28 April-1 May 1996)] Proceedings of 14th VLSI Test Symposium - Self-dual parity checking-A new method for on-line testing
Saposhnikov, Vl.V., Dmitriev, A., Goessel, M., Saposhnikov, V.V.Year:
1996
Language:
english
DOI:
10.1109/vtest.1996.510852
File:
PDF, 630 KB
english, 1996