[IEEE Comput. Soc. Press 14th VLSI Test Symposium -...

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[IEEE Comput. Soc. Press 14th VLSI Test Symposium - Princeton, NJ, USA (28 April-1 May 1996)] Proceedings of 14th VLSI Test Symposium - Self-dual parity checking-A new method for on-line testing

Saposhnikov, Vl.V., Dmitriev, A., Goessel, M., Saposhnikov, V.V.
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Year:
1996
Language:
english
DOI:
10.1109/vtest.1996.510852
File:
PDF, 630 KB
english, 1996
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