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[IEEE 2008 IEEE International Test Conference - Santa Clara, CA (2008.10.28-2008.10.30)] 2008 IEEE International Test Conference - Test Generation for Interconnect Opens
Xijiang Lin,, Rajski, J.Year:
2008
Language:
english
DOI:
10.1109/TEST.2008.4700640
File:
PDF, 1.59 MB
english, 2008