[IEEE Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004 - Taiwan (5-8 July 2004)] Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004 (IEEE Cat. No.04TH8743) - Hot carrier degradation in LDMOS power transistors
Chih-Chang Cheng,, Wu, J.W., Lee, C.C., Shao, J.H., Wang, T.Year:
2004
Language:
english
DOI:
10.1109/ipfa.2004.1345626
File:
PDF, 192 KB
english, 2004