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[IEEE IEEE 1995 Custom Integrated Circuits Conference - Santa Clara, CA, USA (1-4 May 1995)] Proceedings of the IEEE 1995 Custom Integrated Circuits Conference - 3-D extraction techniques for signal integrity analysis
Chou, M., Kamon, M., Nabors, K., Phillips, J., White, J.Year:
1995
Language:
english
DOI:
10.1109/cicc.1995.518207
File:
PDF, 354 KB
english, 1995