[IEEE 13th IEEE International On-Line Testing Symposium (IOLTS 2007) - Crete, Greece (2007.07.8-2007.07.11)] 13th IEEE International On-Line Testing Symposium (IOLTS 2007) - A Configurable Modular Test Processor and Scan Controller Architecture
Brandenburg, R. Frost, Rudolph, D., Galke, C., Kothe, R., Vierhaus, H.T.Year:
2007
Language:
english
DOI:
10.1109/iolts.2007.6
File:
PDF, 213 KB
english, 2007