[IEEE 2013 Fifth International Conference on Measuring...

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[IEEE 2013 Fifth International Conference on Measuring Technology and Mechatronics Automation (ICMTMA 2013) - Hong Kong (2013.1.16-2013.1.17)] 2013 Fifth International Conference on Measuring Technology and Mechatronics Automation - A Novel Measuring Method of Circular Run-Out in any Direction

Piao Weiying,, Xu Lianhu,, Yuan Yibao,, Sun Tao,
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Year:
2013
Language:
english
DOI:
10.1109/icmtma.2013.28
File:
PDF, 141 KB
english, 2013
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