![](/img/cover-not-exists.png)
[IEEE 1991, International Test Conference - Nashville, TN (Oct. 26-30 1991)] 1991, Proceedings. International Test Conference - Aliasing and Diagnosis Probability in MISR and STUMPS Using a General Error Model
Karpovsky, M.G., Gupta, S.K., Pradhan, D.K.Year:
1991
Language:
english
DOI:
10.1109/test.1991.519748
File:
PDF, 932 KB
english, 1991