[IEEE 2011 6th International Microsystems, Packaging,...

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[IEEE 2011 6th International Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT) - Taipei, Taiwan (2011.10.19-2011.10.21)] 2011 6th International Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT) - Drop test for Sn96.7-Ag3.7 polymer core solder ball in BGA package

Shih, Tien-Tsorng, Chen, Bing-Hua, Lee, Win-Der, Wang, Mu-Chun
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Year:
2011
Language:
english
DOI:
10.1109/IMPACT.2011.6117247
File:
PDF, 1015 KB
english, 2011
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