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[IEEE 53rd Electronic Components and Technology Conference, 2003. - New Orleans, Louisiana, USA (May 27-30, 2003)] 53rd Electronic Components and Technology Conference, 2003. Proceedings. - Evaluation of low stress dielectrics for board application
Brownlee, K., Shinotani, K., Raj, P.M., Bbattacharya, S.K., Wong, C.P., Tummala, R.R.Year:
2003
Language:
english
DOI:
10.1109/ectc.2003.1216268
File:
PDF, 520 KB
english, 2003