[IEEE 2003 International Symposium on VLSI Technology, Systems and Applications. Proceedings of Technical Papers - Hsinchu, Taiwan (6-8 Oct. 2003)] 2003 International Symposium on VLSI Technology, Systems and Applications. Proceedings of Technical Papers. (IEEE Cat. No.03TH8672) - Hot-carrier-induced degradation on 0.1μm partially depleted SOI CMOSFET

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