The effect of charge collection recovery in silicon p–n...

The effect of charge collection recovery in silicon p–n junction detectors irradiated by different particles

E. Verbitskaya, M. Abreu, P. Anbinderis, T. Anbinderis, N. D'Ambrosio, W. de Boer, E. Borchi, K. Borer, M. Bruzzi, S. Buontempo, L. Casagrande, W. Chen, V. Cindro, B. Dezillie, A. Dierlamm, V. Eremin,
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Volume:
514
Year:
2003
Language:
english
Pages:
15
DOI:
10.1016/j.nima.2003.08.083
File:
PDF, 314 KB
english, 2003
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