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Specific contact resistivity of metal-semiconductor contacts-a new, accurate method linked to spreading resistance
Carver, G.P., Kopanski, J.J., Novotny, D.B., Forman, R.A.Volume:
35
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/16.2483
Date:
April, 1988
File:
PDF, 1023 KB
english, 1988