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[IEEE 2013 IEEE XXXIII International Scientific Conference on Electronics and Nanotechnology (ELNANO 2013) - Kiev (2013.4.16-2013.4.19)] 2013 IEEE XXXIII International Scientific Conference Electronics and Nanotechnology (ELNANO) - Automatic pattern recognition of epileptiform discharges using morphological descriptors and linear discriminant analysis
Fredel Boos, Christine, Mendes de Azevedo, FernandoYear:
2013
Language:
english
DOI:
10.1109/elnano.2013.6552017
File:
PDF, 305 KB
english, 2013