Wire-bond failures induced by resonant vibrations in the...

Wire-bond failures induced by resonant vibrations in the CDF silicon detector

G. Bolla, M. Atac, V. Pavlicek, S. Nahn, M. Garcia-Sciveres, R. Mumford, T. Nguyen, S. Forrester, C. Hill, J. Olszewski, A. Rahaman, J. Goldstein, B. Ashmanskas, T. Maruyama, T. Zimmerman, S. Moccia,
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Volume:
518
Year:
2004
Language:
english
Pages:
4
DOI:
10.1016/j.nima.2003.10.081
File:
PDF, 242 KB
english, 2004
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