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[IEEE Conference on Precision Electromagnetic Measurements Digest - Boulder, CO, USA (27 June-1 July 1994)] Proceedings of Conference on Precision Electromagnetic Measurements Digest - An original passive device for on-wafer noise parameter measurement verification
Boudiaf, A., Dubon-Chevallier, C., Pasquet, D.Year:
1994
Language:
english
DOI:
10.1109/CPEM.1994.333237
File:
PDF, 166 KB
english, 1994