![](/img/cover-not-exists.png)
[IEEE 2009 22nd International Conference on VLSI Design: concurrently with the 8th International Conference on Embedded Systems - New Delhi, India (2009.01.5-2009.01.9)] 2009 22nd International Conference on VLSI Design - A Novel Approach for Improving the Quality of Open Fault Diagnosis
Yamazaki, Koji, Tsutsumi, Toshiyuki, Takahashi, Hiroshi, Higami, Yoshinobu, Aikyo, Takashi, Takamatsu, Yuzo, Yotsuyanagi, Hiroyuki, Hashizume, MasakiYear:
2009
Language:
english
DOI:
10.1109/vlsi.design.2009.53
File:
PDF, 259 KB
english, 2009