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A Simplified Design Model for Random Process Variability
Wang, Victoria, Agarwal, Kanak, Nassif, Sani R., Nowka, Kevin J., Markovic, DejanVolume:
22
Language:
english
Journal:
IEEE Transactions on Semiconductor Manufacturing
DOI:
10.1109/TSM.2008.2011630
Date:
February, 2009
File:
PDF, 892 KB
english, 2009