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[IEEE 2008 IEEE International Symposium on Electromagnetic Compatibility - EMC 2008 - Detroit, MI (2008.08.18-2008.08.22)] 2008 IEEE International Symposium on Electromagnetic Compatibility - Multiconductor transmission line modeling with VHDL-AMS for EMC applications
Zhang, H., Siebert, K., Frei, S., Wenzel, T., Mickisch, W.Year:
2008
Language:
english
DOI:
10.1109/isemc.2008.4652114
File:
PDF, 371 KB
english, 2008