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[IEEE 2009 IEEE International SOI Conference - Foster City, CA, USA (2009.10.5-2009.10.8)] 2009 IEEE International SOI Conference - Investigation of bias-dependent series resistances and barrier height in Double Gate Schottky MOSFETs
Bhandari, Jyotshna, Vinet, Maud, Poiroux, Thierry, Sallese, Jean Michel, Previtali, Bernard, Deleonibus, Simon, Ionescu, Adrian M.Year:
2009
Language:
english
DOI:
10.1109/soi.2009.5318738
File:
PDF, 833 KB
english, 2009