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[IEEE 4th International Conference on Solid-State and IC Technology - Beijing, China (24-28 Oct. 1995)] Proceedings of 4th International Conference on Solid-State and IC Technology - New mechanism of contact electromigration

Eungsoo Kim,, Kyung-Won Cho,, Hyung-Woo Jang,, Soon-Kwon Lim,
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Year:
1995
Language:
english
DOI:
10.1109/icsict.1995.499264
File:
PDF, 340 KB
english, 1995
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