[IEEE 4th International Conference on Solid-State and IC Technology - Beijing, China (24-28 Oct. 1995)] Proceedings of 4th International Conference on Solid-State and IC Technology - New mechanism of contact electromigration
Eungsoo Kim,, Kyung-Won Cho,, Hyung-Woo Jang,, Soon-Kwon Lim,Year:
1995
Language:
english
DOI:
10.1109/icsict.1995.499264
File:
PDF, 340 KB
english, 1995