Heavy Ion Testing and 3-D Simulations of Multiple Cell...

IEEE Transactions on Nuclear Science 2008 / 08 Vol. 55; Iss. 4

Heavy Ion Testing and 3-D Simulations of Multiple Cell Upset in 65 nm Standard SRAMs

Giot, Damien, Roche, Philippe, Gasiot, Gilles, Autran, Jean-Luc, Harboe-Sorensen, Reno
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Volume:
55
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2008.916063
Date:
August, 2008
File:
PDF, 970 KB
english, 2008
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