[IEEE 2008 58th Electronic Components and Technology Conference (ECTC 2008) - Lake Buena Vista, FL, USA (2008.05.27-2008.05.30)] 2008 58th Electronic Components and Technology Conference - Comparison of electromigration performance for Pb-free solders and surface finishes with Ni UBM
Lu, Minhua, Lauro, Paul, Shih, Da-Yuan, Polastre, Robert, Goldsmith, Charles, Henderson, Donald W., Zhang, Hongqing, Moon Gi Cho,Year:
2008
Language:
english
DOI:
10.1109/ectc.2008.4549996
File:
PDF, 805 KB
english, 2008