[IEEE 17th International Zurich Symposium on Electromagnetic Compatibility - Singapore (2006.02.27-2006.03.3)] 2006 17th International Zurich Symposium on Electromagnetic Compatibility - Radiated emission analysis from printed circuit board edges using multiple stimulus sources
Montrose, M.I., En-Xiao Liu,Year:
2006
Language:
english
DOI:
10.1109/emczur.2006.214999
File:
PDF, 386 KB
english, 2006