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[IEEE 2012 IEEE 12th International Conference on Nanotechnology (IEEE-NANO) - Birmingham, United Kingdom (2012.08.20-2012.08.23)] 2012 12th IEEE International Conference on Nanotechnology (IEEE-NANO) - Study on the influence rules of static mechanical errors in four-linkage precision measuring instrument and the realization of real-time error correction with computer-aided modeling method
Ding Jianjun,, Ma Fulu,, Liu Yangpeng,, Chen Xiaolong,, Jiang Zhuangde,, Li Bing,Year:
2012
Language:
english
DOI:
10.1109/NANO.2012.6322039
File:
PDF, 869 KB
english, 2012