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[IEEE 2003 International Symposium on VLSI Technology, Systems and Applications. Proceedings of Technical Papers - Hsinchu, Taiwan (6-8 Oct. 2003)] 2003 International Symposium on VLSI Technology, Systems and Applications. Proceedings of Technical Papers. (IEEE Cat. No.03TH8672) - Built-in high resolution signal generator for testing ADC and DAC
Yeong-Jar Chang,, Soon-Jyh Chang,, Jung-Chi Ho,, Chee-Kian Ong,, Ting Cheng,, Wen-Ching Wu,Year:
2003
Language:
english
DOI:
10.1109/vtsa.2003.1252595
File:
PDF, 332 KB
english, 2003