[IEEE 2011 International Symposium on Quality Electronic Design (ISQED) - Santa Clara, CA, USA (2011.03.14-2011.03.16)] 2011 12th International Symposium on Quality Electronic Design - Constraint generation for software-based post-silicon bug masking with scalable resynthesis technique for constraint optimization
Chang, Chia-Wei, Chou, Hong-Zu, Chang, Kai-Hui, Jiang, Jie-Hong Roland, Liu, Chien-Nan Jimmy, Hsiao, Chiu-Han, Kuo, Sy-YenYear:
2011
Language:
english
DOI:
10.1109/isqed.2011.5770722
File:
PDF, 98 KB
english, 2011