0.3-nm SASE-FEL at PAL

0.3-nm SASE-FEL at PAL

J.S Oh, D.E Kim, E.S Kim, S.J Park, H.S Kang, T.Y Lee, T.Y Koo, S.S Chang, C.W Chung, S.H Nam, W Namkung
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Volume:
528
Year:
2004
Language:
english
Pages:
4
DOI:
10.1016/j.nima.2004.04.106
File:
PDF, 236 KB
english, 2004
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