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[IEEE 2013 Joint IEEE Int'l Symp on Applications of Ferroelectrics & Workshop on Piezoresponse Force Microscopy (ISAF/PFM) - Prague 4, Czech Republic (2013.07.21-2013.07.25)] 2013 Joint IEEE International Symposium on Applications of Ferroelectric and Workshop on Piezoresponse Force Microscopy (ISAF/PFM) - A new method of dielectric characterization in the microwave range for high-k ferroelectric thin films
Nadaud, Kevin, Gundel, Hartmut W., Borderon, Caroline, Gillard, Raphael, Fourn, ErwanYear:
2013
Language:
english
DOI:
10.1109/isaf.2013.6748698
File:
PDF, 536 KB
english, 2013