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[IEEE 2008 International Symposium on Electromagnetic Compatibility - EMC Europe - Hamburg, Germany (2008.09.8-2008.09.12)] 2008 International Symposium on Electromagnetic Compatibility - EMC Europe - Finding weak spots in lightning protection
Bargboer, G., van Deursen, A.P.J., Nguyen, C.V., Steenstra, H.T., Bosveld, T., Parrado Curros, R., Broekmeulen, J.P.M.Year:
2008
Language:
english
DOI:
10.1109/emceurope.2008.4786895
File:
PDF, 584 KB
english, 2008