Ion beam induced charge imaging of epitaxial GaN detectors

Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 2004 Vol. 531; Iss. 1-2

Ion beam induced charge imaging of epitaxial GaN detectors

P.J. Sellin, D. Hoxley, A. Lohstroh, A. Simon, W. Cunningham, M. Rahman, J. Vaitkus, E. Gaubas
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Volume:
531
Year:
2004
Language:
english
Pages:
5
DOI:
10.1016/j.nima.2004.05.078
File:
PDF, 301 KB
english, 2004
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