[IEEE 2012 13th International Symposium on Quality...

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[IEEE 2012 13th International Symposium on Quality Electronic Design (ISQED) - Santa Clara, CA, USA (2012.03.19-2012.03.21)] Thirteenth International Symposium on Quality Electronic Design (ISQED) - Quasi-Planar Tri-gate (QPT) bulk CMOS technology for single-port SRAM application

Tsukamoto, Yasumasa, Yabuuchi, Makoto, Fujiwara, Hidehiro, Nii, Koji, Shin, Changhwan, Liu, Tsu-Jae King
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Year:
2012
Language:
english
DOI:
10.1109/isqed.2012.6187505
File:
PDF, 1021 KB
english, 2012
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