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[IEEE 2008 International Symposium on VLSI Technology, Systems, and Applications (VLSI-TSA) - Hsinchu, Taiwan (2008.04.21-2008.04.23)] 2008 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) - Statistical Compact Modeling of Variations in Nano MOSFETs

Lin, Chung-Hsun, Dunga, Mohan V., Lu, Darsen, Niknejad, Ali M., Hu, Chenming
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Year:
2008
Language:
english
DOI:
10.1109/vtsa.2008.4530849
File:
PDF, 1.50 MB
english, 2008
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