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[IEEE 2013 9th Conference on Ph.D. Research in Microelectronics and Electronics (PRIME) - Villach, Austria (2013.06.24-2013.06.27)] Proceedings of the 2013 9th Conference on Ph.D. Research in Microelectronics and Electronics (PRIME) - Application of Bayesian networks to predict SMART power semiconductor lifetime
Plankensteiner, Kathrin, Bluder, Olivia, Pilz, JurgenYear:
2013
Language:
english
DOI:
10.1109/prime.2013.6603175
File:
PDF, 246 KB
english, 2013