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[IEEE 2009 12th International Symposium on Design and Diagnostics of Electronic Circuits & Systems - Liberec, Czech Republic (2009.04.15-2009.04.17)] 2009 12th International Symposium on Design and Diagnostics of Electronic Circuits & Systems - Physical design oriented DRAM Neighborhood Pattern Sensitive Fault testing
Sfikas, Yiorgos, Tsiatouhas, YiorgosYear:
2009
Language:
english
DOI:
10.1109/DDECS.2009.5012108
File:
PDF, 575 KB
english, 2009