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[IEEE 2012 IEEE 55th International Midwest Symposium on Circuits and Systems (MWSCAS) - Boise, ID, USA (2012.08.5-2012.08.8)] 2012 IEEE 55th International Midwest Symposium on Circuits and Systems (MWSCAS) - Cumulant characterizations of ADC error sources with applications to Time Interleaved ADCs
Parkey, Charna R., Mikhael, Wasfy B, Chester, David B.Year:
2012
Language:
english
DOI:
10.1109/mwscas.2012.6292229
File:
PDF, 241 KB
english, 2012